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HN1D01FU
TOSHIBA Diode Silicon Epitaxial Planar Type
HN1D01FU
Ultra High Speed Switching Application
l Small package l Low forward voltage l Small total capacitance : VF (3) = 0.92V (typ.) : CT = 2.2pF (typ.) l Fast reverse recovery time : trr = 1.6ns (typ.) Unit in mm
Maximum Ratings (Ta = 25C)
Characteristic Maximum (peak) reverse voltage Reverse voltage Maximum (peak) forward current Average forward current Surge current (10ms) Power dissipation Junction temperature Storage temperature Symbol VRM VR IFM IO IFSM P Tj Tstg Rating 85 80 300* 100* 2* 200 125 -55~125 Unit V V mA mA A mW C C
*: This is the Maximum Ratings of single diode (Q1 or Q2 or Q3 or Q4). In the case of using Unit 1 and Unit 2 independently or simultaneously, the Maximum Ratings per diode is 75% of the single diode one.
JEDEC EIAJ TOSHIBA Weight: 6.8mg
1-2T1B
Electrical Characteristics (Q1, Q2, Q3, Q4 Common, Ta = 25C)
Characteristic Symbol VF (1) Forward voltage VF (2) VF (3) Reverse current Total capacitance Reverse recovery time IR (1) IR (2) CT trr Test Circuit Test Condition IF = 1mA IF = 10mA IF = 100mA VR = 30V VR = 80V VR = 0, f = 1MHz IF = 10mA (fig.1) Min Typ. 0.61 0.74 0.92 2.2 1.6 Max 1.20 0.1 0.5 4.0 4.0 A pF ns
000707EAA1
Unit
V
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc.. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others. * The information contained herein is subject to change without notice.
2001-02-08
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HN1D01FU
Pin Assignment (Top View) Marking
Fig.1 Reverse Recovery Time (trr) Test Circuit
2001-02-08
2/3
HN1D01FU
Q1, Q,2, Q3, Q4 Common
Q1, Q,2, Q3, Q4 Common
Q1, Q,2, Q3, Q4 Common
Q1, Q,2, Q3, Q4 Common
2001-02-08
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